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TITAN™ T250MA & T250MS Probes Introducing MPI TITAN™ Single-Ended & Differential RF Probes DC-250 GHz Broadband Probing Solutions for Next-Gen RF,
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全方位打造量測方案 AST [Image: A201-1114-FFB81C] Thermal [Image: T201-1114-FFB81C.png] [Image: MPI Thermal ThermalAir Product Line Up] Celadon [Image: LCD Driver Probe Card] [Image: PC201-1114-FFB81C] Ultra-High Performance Probe Card With the Lowest Cost of Ownership Delivering Extreme Test Capabilities
Lightium、旺矽科技與Axiomatic_AI宣佈建立策略聯盟 攜手打造由AI驅動徹底革新光子晶片測試解決方案 瑞士蘇黎世、台灣新竹和美國波士頓2025年8月5日 /美通社/ – Lightium AG、旺矽科技股份有限公司(MPI Corporation)與Axiomatic_AI Inc.宣布簽署合作備忘錄(MoU)，將共同開發全球首款智慧化、自主化、整合式光子元件測試方案（Intelligent, Autonomous, and Integrated Test Solution，簡稱 IAITS）... Lightium、旺矽科技與Axiomatic_AI宣佈建立策略聯盟 攜手打造由AI驅動徹底革新光子晶片測試解決方案
Advanced Semiconductor Test [Image: MPI Lightium] SEMICON TAIWAN 2025 SEMICON TAIWAN 2025 國際半導體展 Probe Card | Photonics Automation |
Advanced Semiconductor Test | Thermal [Image: SEMICON Taiwan Logo] IS-Test – Workshop – ITWS IS-Test – Workshop – ITWS [Image: Logo] EuMW 2025 Advanced Semiconductor Test | Thermal [Image: EuMW 2025 Logo] 地點: 荷蘭烏特勒支 Jaarbeurs 會議中心 ECOC 2025 Advanced Semiconductor Test [Image: ECOC 2025 Logo] 旺矽科技先進半導體測試部門與是德科技攜手合作，成為是德科技解決方案合作夥伴 旺矽科技先進半導體測試部門與是德科技攜手合作，成為是德科技解決方案合作夥伴
Advanced Semiconductor Test 新竹2024年3月11日 — 半導體測試解決方案的全球領導者旺矽科技股份有限公司 (MPI Corporation) 欣然宣布與全球創新合作夥伴是德科技 (Keysight Technologies) 建立具里程碑意義的合作夥伴關係。是德科技致力於提供市場領先的設計、模擬和測試解決方案，幫助工程師加快產品的開發和部署。此次合作標誌著旺矽科技先進半導體測試 (AST) 部門的... 旺矽科技先進半導體測試部門實現高達110 GHz的可追溯射頻校準突破 旺矽科技先進半導體測試部門實現高達110 GHz的可追溯射頻校準突破
Advanced Semiconductor Test 德國布倫瑞克2024年1月25日 —作為晶圓級測試解決方案的先驅，旺矽科技股份有限公司 (MPI Corporation) 的先進半導體測試 (AST) 部門今天宣佈在射頻校準技術方面取得一項重大成果。該部門與德國聯邦物理技術研究院 (PTB) 合作，在表徵高達110 GHz的商用校正片方面成功實現了完全可追溯性。 MPI SENTIO® and QAlibria® Unsurpassed Usability is Now Extended to Automated Four-Port RF System Calibration MPI SENTIO® 和 QAlibria® 現已涵蓋四端口射頻系統自動校準 Advanced Semiconductor Test 新竹2022年12月13日 — MPI Corporation的 先進半導體測試部門 是半導體射頻測試解決方案的市場領導者及創新先鋒，該部門演示了無人值守的四端口射頻校準和量測，由 MPI 完全整合的射頻校準和探針台系統控制軟體套件——新版本的 QAlibria® and SENTIO® 支援。 Slide 2 - TS2000-SE Configured with the New MPI THZ-Selection TS2000-IFE Series – THZ Selection Advanced Semiconductor Test THZ-Selection converts the TS2000-IFE into a dedicated, RF, mmW, THZ and load-pull probe station, as first one on the market without compromising measurement directivity and accuracy at wide temperature range from -60°C to +300°C. Celadon Multisite Tile-on-Card™ Production Probe Card Celadon Multisite Tile-on-Card™ Production Probe Card Functional Test, 200C, Production Probe Card Celadon Cryogenic Minitile™ Celadon Cryogenic Minitile™ Cryogenic, 4K and 77K, Positioner Mounted, 22 pin Probe Card Celadon VC20™, 45e™ Probe Card Adaptor, and Insertion Tool Celadon VC20™, 45e™ Probe Card Adaptor, and Insertion Tool Modular, -65C to 200C, 48 channel, probe card and adaptor, used for Modeling, Characterization, Parametric Test, and WLR testing Celadon VC43™ and P9000 Production Parametric Probe Card Celadon VC43™ and P9000 Production Parametric Probe Card Modular, -65 to 200C, 100 channel, Probe Card Slide 2 - TS2000-SE Configured with the New MPI THZ-Selection The Latest in mmWave and THz Test and Measurement Technology
Advanced Semiconductor Test This eBook is a collection of articles on the various innovations in measurement methods and equipment that has been developed to address these higher frequencies ranging from mmWave up to 1.1 THz. (This eBook was published by Microwave Journal)
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